LighTopTech at SPIE Optifab 2015
Cristina Canavesi is presenting a paper at SPIE Optifab: Gabor-domain optical coherence microscopy with integrated dual-axis MEMS scanner for fast 3D imaging and metrology Paper 9633-22 Time: Monday, Oct. 12th, 5:00 PM - 5:20 PM Author(s): Cristina Canavesi, LighTopTech Corp. (United States); Andrea Cogliati, Adam Hayes, Univ. of Rochester...
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