LighTopTech at SPIE Optifab 2015

Cristina Canavesi is presenting a paper at SPIE Optifab:

Gabor-domain optical coherence microscopy with integrated dual-axis MEMS scanner for fast 3D imaging and metrology

Paper 9633-22

Time: Monday, Oct. 12th, 5:00 PM – 5:20 PM

Author(s): Cristina Canavesi, LighTopTech Corp. (United States); Andrea Cogliati, Adam Hayes, Univ. of Rochester (United States); Anand P. Santhanam, Univ. of California, Los Angeles (United States); Patrice Tankam, Jannick P. Rolland, Univ. of Rochester (United States)

http://spie.org/OFB/conferencedetails/optical-fabrication